1-745269-1

ICC Number:AMP1-745269-1
Manufacturer:TE Connectivity
Manufacturer Number:1-745269-1
Datasheet:Datasheet
ECAD Model:
3D Model

Description:

CONT,SOCKET,HDE,#22-26

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Specifications

AttributeValue
Product Category:
Manufacturer:TE Connectivity
Manufacturer Part Number:TE Connectivity 1-745269-1
Series:AMPLIMITE HDE
Gender:Female
Termination Method:Insulation Displacement Crimp (IDC)
Contact Material:Phosphor Bronze
Contact Size:20
Contact Type:Socket
Contact Amperage:2.4 A
Operating Temperature Range:-55 - 105 °C, -67 - 221 °F
Circuit Application:Signal
Contact Mating Area Plating:Gold
Contact Mating Area Plating Thickness:30 µin
Contact Underplating Material:Nickel
PCB Contact Termination Area Plating:Tin
PCB Termination Area Plating Finish:Bright
Connector and Contact Terminate To:Wire & Cable
Wire Size:.15 - .4 mm², 22 - 26 AWG
Product Grade:Standard
Connector System:Cable-to-Cable
Wire Insulation Diameter:.054 in, 1.37 mm
Connector Product Type:Contact
Wire Insulation Support:With
Accepts Wire Insulation Diameter:.054 in, 1.37 mm
Double Wire Insulation Diameter:.039 in, .99 mm
Part Aliases:1-745269-1
SKU:AMP1-745269-1

Detailed Description

CONT,SOCKET,HDE,#22-26 is a high-performance female connector designed for signal applications in harsh environments. Featuring Insulation Displacement Crimp (IDC) termination, this contact ensures secure and reliable connections to 22-26 AWG wires. Constructed from durable phosphor bronze with a gold-plated mating area, it offers excellent conductivity and corrosion resistance. With a current rating of 2.4 A, this contact is suitable for various power and signal transmission needs. Operating in a wide temperature range from -55 to 105 °C, it is ideal for use in demanding industrial and aerospace applications. RoHS compliant and with EAR99 classification, this connector meets international standards for environmental and export regulations. Whether for cable-to-cable connections or wire and cable terminations, the CONT,SOCKET,HDE,#22-26 ensures superior performance and reliability in mission-critical systems.